By Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
Modern electronics rely on nanoscaled applied sciences that current new demanding situations when it comes to trying out and diagnostics. stories are quite susceptible to defects in view that they take advantage of the know-how limits to get the top density. This ebook is a useful consultant to the trying out and diagnostics of the newest new release of SRAM, probably the most largely utilized different types of reminiscence. Classical equipment for trying out reminiscence are designed to deal with the so-called "static faults," yet those try out recommendations will not be adequate for faults which are rising within the most up-to-date Very Deep Sub-Micron (VDSM) applied sciences. those new fault versions, often called "dynamic faults", aren't coated by way of classical try out strategies and require the devoted try sequences awarded during this book.
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Extra info for Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel